Photolumineszenz-Mapper-NIR - PR1150863-3240-W
Open
The source does not publish a status. We worked this out from the opening and closing dates it does publish.
Photoluminescences is a versaille method for characterisation of direct semiconductors. In epitaxy typically whole wafers get PL-mapped to achive information on bandgap, uniformity, layer thickness or cavity dip. The desired tool is capable to measure in a spectral range from 800-2150nm, due to the (AlInGa)(AsP)-heterostructures which are matter of investigations. The setup is capable of mapping entire 2 - 6 inch (50mm - 150mm) wafers. Options: 1. Excitation density tuning for Laser 1 (automized) 2. Laser 2 (DPSS) for InGaAs-contact bleach out for layers with thickness 50 - 200nm 3. Sample holder: Flexible sample positioning on entire chuck with vacuum clamping 4. Sample holder: Mount for DataRay BladeCam2
- Status
- Open
- Deadline
- Published
- Country
- Germany
- Funder
- Fraunhofer-Gesellschaft, Einkauf B12
- Official page
- Open at the source portal
What applying involves
2 steps, all of them taken from this call's own documents.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-09
- Document fingerprint
5c5df12458115674(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- url first recorded as https://vergabe.fraunhofer.de/NetServer/TenderingProcedureDetails?function=_Details&TenderOID=54321-Tender-1a033c0431d-46dcc5f09fb73bb5 on
- deadline first recorded as 2026-10-05 on
- published_on first recorded as 2026-09-02 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as Photolumineszenz-Mapper-NIR - PR1150863-3240-W on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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