Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
Closed
The source does not publish a status. We worked this out from the opening and closing dates it does publish.
1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF.
- Status
- Closed
- Deadline
- Published
- Country
- Germany
- Funder
- Fraunhofer-Gesellschaft, Einkauf B12
- Official page
- Open at the source portal
What applying involved
2 steps, all of them taken from this call's own documents.
This call is closed. The steps below show what applying involved, and are kept for reference only.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-08
- Document fingerprint
20bc2ae980c2531f(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- status changed from open to closed on
- url first recorded as https://vergabe.fraunhofer.de/NetServer/TenderingProcedureDetails?function=_Details&TenderOID=54321-Tender-19ebe5290d4-3be2c55119b968e0 on
- deadline first recorded as 2026-09-23 on
- published_on first recorded as 2026-08-21 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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