High resolution X-ray inspection tool
Open
Not published as a status — worked out here from the application dates.
The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detec
- Status
- Open
- Deadline
- Published
- Country
- Germany
- Official page
- Open at the source portal
What applying involves
2 steps, every one of them taken from what this call's own documents state.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-08
- Document fingerprint
b37acc89829a0774(SHA-256, first 16 hex characters)- Retrieved
- First recorded here
What has changed
- published_on changed from 2026-08-04 to 2026-08-05 on
- title changed from High resolution nano-XCT system to High resolution X-ray inspection tool on
- url first recorded as https://www.evergabe-online.de/tenderdocuments.html?id=880834 on
- deadline first recorded as 2026-09-04 on
- published_on first recorded as 2026-08-04 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as High resolution nano-XCT system on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
Retrieved from the source on .
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