High resolution X-ray inspection tool
Closed
The source does not publish a status. We worked this out from the opening and closing dates it does publish.
The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detec
- Status
- Closed
- Deadline
- Published
- Country
- Germany
- Funder
- Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen
- Official page
- Open at the source portal
What applying involved
2 steps, all of them taken from this call's own documents.
This call is closed. The steps below show what applying involved, and are kept for reference only.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-09
- Document fingerprint
25dea4a2c9ca62fd(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- deadline changed from 2026-09-04 to 2026-09-17 on
- published_on changed from 2026-08-05 to 2026-08-31 on
- published_on changed from 2026-08-04 to 2026-08-05 on
- title changed from High resolution nano-XCT system to High resolution X-ray inspection tool on
- deadline changed from 2026-09-17 to 2026-09-04 on
- published_on changed from 2026-08-31 to 2026-08-04 on
- title changed from High resolution X-ray inspection tool to High resolution nano-XCT system on
- deadline changed from 2026-09-04 to 2026-09-17 on
- published_on changed from 2026-08-05 to 2026-08-31 on
- published_on changed from 2026-08-04 to 2026-08-05 on
- title changed from High resolution nano-XCT system to High resolution X-ray inspection tool on
- deadline changed from 2026-09-17 to 2026-09-04 on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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