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SOC-Testsystem - PR1251693-2270-W

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This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.

Status
Open
Deadline
Published
Country
Germany
Official page
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Source document
https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-08
Document fingerprint
b37acc89829a0774 (SHA-256, first 16 hex characters)
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Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.

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