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SOC-Testsystem - PR1251693-2270-W

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This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.

Status
Closed
Deadline
Published
Country
Germany
Funder
Fraunhofer-Gesellschaft, Einkauf B12
Official page
Open at the source portal

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Source document
https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-09
Document fingerprint
25dea4a2c9ca62fd (SHA-256, first 16 hex characters)
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Data source

Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.

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