SOC-Testsystem - PR1251693-2270-W
Open
Not published as a status — worked out here from the application dates.
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.
- Status
- Open
- Deadline
- Published
- Country
- Germany
- Official page
- Open at the source portal
What applying involves
2 steps, every one of them taken from what this call's own documents state.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-08
- Document fingerprint
b37acc89829a0774(SHA-256, first 16 hex characters)- Retrieved
- First recorded here
What has changed
- url first recorded as https://vergabe.fraunhofer.de/NetServer/TenderingProcedureDetails?function=_Details&TenderOID=54321-Tender-19fdbb3f9ac-1f370ab60485e598 on
- deadline first recorded as 2026-09-07 on
- published_on first recorded as 2026-08-07 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as SOC-Testsystem - PR1251693-2270-W on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
Retrieved from the source on .
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