200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) - PR1227015-2440-P
Closed
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1 Stück 200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) This specification describes the requirements for one wafer probing system to be used for characterization and test engineering for sensor ICs and chiplets at the Fraunhofer IIS. The system must allow handling of 200 mm and 300 mm wafers and 300 mm dicing frames. The focus in the usage of the machine does not depend on short handling time and high throughput, but on accuracy in probing and possibility for stimulation of optical and magnetical sensors. For stimulation of optical sensors a darkened DuT chamber is mandatory. The Wafer Chuck has to be made off non-magnetic metarials to prevent distortion while characterizing magnetic field sensors. Option: 4.2 Wafer-Spannfutter ATT-Trockenluftregelung 4.9 Wafer-Spannfutter Hochspannungsvorbereitung 5.5 Beladung OCR-Lesegerät (Oberseite) 5.6 Beladung Wafer-ID-Erfassung für Text mit Standard- und Nicht-Standard-Schriftarten, Barcode und QR-Code 9.1
- Status
- Closed
- Deadline
- Published
- Country
- Germany
- Funder
- Fraunhofer-Gesellschaft, Einkauf B12
- Official page
- Open at the source portal
What applying involved
2 steps, all of them taken from this call's own documents.
This call is closed. The steps below show what applying involved, and are kept for reference only.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-08
- Document fingerprint
20bc2ae980c2531f(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- status changed from open to closed on
- url first recorded as https://vergabe.fraunhofer.de/NetServer/TenderingProcedureDetails?function=_Details&TenderOID=54321-Tender-19fd1969ef8-70bb5da6851eca1c on
- deadline first recorded as 2026-09-07 on
- published_on first recorded as 2026-08-05 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as 200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) - PR1227015-2440-P on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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