Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers
Open
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Description of the Procurement - Type and Scope of Supplies / Requirements The procurement comprises the supply of a complete semi-automatic wafer prober system for the electrical and RF characterization of 200-mm wafers for research and laboratory applications at IHP. The scope of supply includes, in particular, a semi-automatic 200-mm wafer prober with vacuum chuck, precision XY/Z/Theta positioning, shielded prober chamber, six individual electrical probes, two multi-contact probe holders suitable for RF measurements up to at least 6 GHz, and a probe card adapter. The system shall also include an automated microscope, color and side-view cameras, control PC, hardware control panel, control software, required cables, interfaces, power supplies and replacement probes. The system shall support DC, pulsed I-V and low-frequency impedance measurements up to at least 10 MHz as well as RF characterization. All components shall be technically compatible and capable of being operated as an
- Status
- Open
- Deadline
- Published
- Country
- Germany
- Funder
- IHP GmbH - Lebniz-Institut für innovative Mikroelektronik
- Official page
- Open at the source portal
What applying involves
2 steps, all of them taken from this call's own documents.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
Similar opportunities
- Semi-automatic prober for characterization of 200 mm wafers
- Semi Automatic Prober for characterization of 200 mm Wafers
- Lieferung inkl. Montage und Installation eines Halbautomatischen On-Wafer Prober gemäß Leistungsbeschreibung
- 200 mm Wafer Prober incl. Temperature Testing (IIS-05.1) - PR1227015-2440-P
- Waferprober / Frameprober - PR1252431-2270-W
- Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-09
- Document fingerprint
25dea4a2c9ca62fd(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- url first recorded as https://vergabemarktplatz.brandenburg.de/VMPSatellite/notice/CXSTYYDDYRW8N6CR/documents on
- deadline first recorded as 2026-10-29 on
- published_on first recorded as 2026-09-28 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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