Semi-automatic prober for characterization of 200 mm wafers
Closed
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The procurement comprises the supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall be suitable for DC and pulsed I-V measurements as well as low-frequency impedance measurements up to 10 MHz and shall be capable of integration with the existing Keithley 4200A-SCS characterization system. The scope of supply includes, in particular, a shielded prober chamber with temperature-controlled chuck (-60 °C to +300 °C), six electrical Kelvin probes with triaxial FORCE/SENSE interfaces, automated microscope and camera systems, anti-vibration table, hardware and software control, PC and displays, all required cabling and interfaces, as well as installation, commissioning, integration support, operator training and technical documentation. The supplier shall provide a complete and fully functional system, including all components, interfaces, accessor
- Status
- Closed
- Deadline
- Published
- Country
- Germany
- Funder
- IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
- Official page
- Open at the source portal
What applying involved
2 steps, all of them taken from this call's own documents.
This call is closed. The steps below show what applying involved, and are kept for reference only.
Understand the call
- Read the call on the source portal and download its documents
Submit
- Submit before the closing date shown above
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Where this came from
- Source document
- https://oeffentlichevergabe.de/api/notice-exports?pubMonth=2026-09
- Document fingerprint
25dea4a2c9ca62fd(SHA-256, first 16 hex characters)- Collected
- First recorded here
What has changed
- status changed from open to closed on
- url first recorded as https://vergabemarktplatz.brandenburg.de/VMPSatellite/notice/CXSTYYDDYD9F9RH8/documents on
- deadline first recorded as 2026-10-13 on
- published_on first recorded as 2026-09-11 on
- status_basis first recorded as derived_window on
- status first recorded as open on
- title first recorded as Semi-automatic prober for characterization of 200 mm wafers on
Data source
Source: Datenservice Öffentlicher Einkauf (Bundesministerium für Wirtschaft und Klimaschutz). CC0 1.0 (CC-ZERO) — no conditions.
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